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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 24, Iss. 16 — Aug. 15, 1999
  • pp: 1088–1090

Vision through semireflecting media: polarization analysis

Yoav Y. Schechner, Joseph Shamir, and Nahum Kiryati  »View Author Affiliations


Optics Letters, Vol. 24, Issue 16, pp. 1088-1090 (1999)
http://dx.doi.org/10.1364/OL.24.001088


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Abstract

We present an approach to recovering scenes deteriorated by reflections off a semi-reflecting medium. The approach is based on imaging through a polarizer at two different orientations. We analyze the image-formation process, taking into account changes in reflection and polarization properties owing to internal reflections within the medium. Reconstruction by inverting this process requires estimation of the incidence angle (the inclination of the transparent medium). We estimate this angle by seeking the value that leads to decorrelation of the estimated scenes that are automatically and uniquely labeled reflected–transmitted.

© 1999 Optical Society of America

OCIS Codes
(100.2960) Image processing : Image analysis
(100.3020) Image processing : Image reconstruction-restoration
(150.0150) Machine vision : Machine vision
(260.5430) Physical optics : Polarization

Citation
Yoav Y. Schechner, Joseph Shamir, and Nahum Kiryati, "Vision through semireflecting media: polarization analysis," Opt. Lett. 24, 1088-1090 (1999)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-24-16-1088


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References

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  2. Y. Y. Schechner, N. Kiryati, and R. Basri, in IEEE International Conference on Computer Vision (Institute of Electrical and Electronics Engineers, New York), pp. 1061–1066.
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  9. Link to the raw images through http://www.ee.technion.ac.il/ ~ yoavs/publications.

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