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Optics Letters

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  • Vol. 24, Iss. 5 — Mar. 1, 1999
  • pp: 312–314

Recording of second-harmonic index gratings in photorefractive (K0.5 Na0.5)0.2 (Sr0.75 Ba0.25)0.9 Nb2O6 crystals

Xiaonong Shen, Jianhua Zhao, Ruibo Wang, Xianmin Yi, Pochi Yeh, and Huanchu Chen  »View Author Affiliations


Optics Letters, Vol. 24, Issue 5, pp. 312-314 (1999)
http://dx.doi.org/10.1364/OL.24.000312


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Abstract

We propose and demonstrate a novel method for recording second-harmonic volume index gratings in photorefractive crystals. The fundamental component of the index grating is eliminated by means of a π -phase shifted double-exposure process that uses the Mach–Zehnder interferometric technique. Experimental results for (K0.5 Na0.5) 0.2(Sr> 0.75Ba 0.25)0.9Nb 2O6 crystals are presented and discussed.

© 1999 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(050.2770) Diffraction and gratings : Gratings
(050.5080) Diffraction and gratings : Phase shift
(160.5320) Materials : Photorefractive materials

Citation
Xiaonong Shen, Jianhua Zhao, Ruibo Wang, Xianmin Yi, Pochi Yeh, and Huanchu Chen, "Recording of second-harmonic index gratings in photorefractive (K0.5 Na0.5)0.2 (Sr0.75 Ba0.25)0.9 Nb2O6 crystals," Opt. Lett. 24, 312-314 (1999)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-24-5-312


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