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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 25, Iss. 20 — Oct. 15, 2000
  • pp: 1529–1531

Subwavelength depth resolution in near-field microscopy

David G. Fischer  »View Author Affiliations


Optics Letters, Vol. 25, Issue 20, pp. 1529-1531 (2000)
http://dx.doi.org/10.1364/OL.25.001529


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Abstract

A generalized Radon transform is presented that relates, for the case of an evanescent wave that is incident upon a weakly scattering medium, the homogeneous components of the scattered field to the three-dimensional Fourier transform of the dielectric susceptibility. This relationship is used within the context of total internal reflection microscopy to reconstruct the depth structure of the dielectric susceptibility from simulated scattered field data.

© 2000 Optical Society of America

OCIS Codes
(100.3010) Image processing : Image reconstruction techniques
(180.6900) Microscopy : Three-dimensional microscopy
(290.3200) Scattering : Inverse scattering

Citation
David G. Fischer, "Subwavelength depth resolution in near-field microscopy," Opt. Lett. 25, 1529-1531 (2000)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-25-20-1529

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