The angular positions of the light-scattering minima obtained from structures placed on flat substrates are closely related to the geometry of the scattering object. We show how the profile of a fiber can be determined, and possible irregularities located, by measurement of the backscattering patterns. An approximate double-interaction model is used to fit the results.
© 2000 Optical Society of America
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5820) Instrumentation, measurement, and metrology : Scattering measurements
(290.1350) Scattering : Backscattering
(290.5820) Scattering : Scattering measurements
J. L. de la Peña, J. M. Saiz, and F. González, "Profile of a fiber from backscattering measurements," Opt. Lett. 25, 1699-1701 (2000)