We present experimental results of an imaging technique that uses as a local probe the optical field enhanced at the junction of a scanning tunneling microscope illuminated by a <i>p</i>-polarized laser beam. Images of highly oriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as 10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip–sample distance, yielding the ultrahigh vertical resolution reached in the images.
© 2000 Optical Society of America
A. V. Bragas and O. E. Martínez, "Field-enhanced scanning optical microscope," Opt. Lett. 25, 631-633 (2000)