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Optics Letters

Optics Letters


  • Vol. 25, Iss. 9 — May. 1, 2000
  • pp: 631–633

Field-enhanced scanning optical microscope

A. V. Bragas and O. E. Martínez  »View Author Affiliations

Optics Letters, Vol. 25, Issue 9, pp. 631-633 (2000)

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We present experimental results of an imaging technique that uses as a local probe the optical field enhanced at the junction of a scanning tunneling microscope illuminated by a p-polarized laser beam. Images of highly oriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as 10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip–sample distance, yielding the ultrahigh vertical resolution reached in the images.

© 2000 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(240.6680) Optics at surfaces : Surface plasmons

A. V. Bragas and O. E. Martínez, "Field-enhanced scanning optical microscope," Opt. Lett. 25, 631-633 (2000)

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