OSA's Digital Library

Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 26, Iss. 11 — Jun. 1, 2001
  • pp: 792–794

Multilayer mirror for x rays below 190 eV

C. Michaelsen, J. Wiesmann, R. Bormann, C. Nowak, C. Dieker, S. Hollensteiner, and W. Jäger  »View Author Affiliations


Optics Letters, Vol. 26, Issue 11, pp. 792-794 (2001)
http://dx.doi.org/10.1364/OL.26.000792


View Full Text Article

Acrobat PDF (452 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

La/B<sub>4</sub>C multilayers have been fabricated by magnetron sputtering for use as x-ray mirrors at energies below 190 eV, particularly for detection of boron <i>K</i> and α <i>x</i> rays at 183 eV, their performance has been compared with that of Mo/B<sub>4</sub>C multilayers, which are currently the best-performing multilayers for this energy range. Transmission electron microscopy and synchrotron soft-x-ray reflectometry were used to study the structural quality of the multilayers and their performance as x-ray mirrors. The results show a significant improvement of the peak reflectivity and the spectral purity, indicating that La/B<sub>4</sub>C has a high potential to replace Mo/B<sub>4</sub>C in many x-ray optical applications below 190 eV.

© 2001 Optical Society of America

OCIS Codes
(120.5700) Instrumentation, measurement, and metrology : Reflection
(230.1480) Optical devices : Bragg reflectors
(230.4170) Optical devices : Multilayers
(340.0340) X-ray optics : X-ray optics
(340.6720) X-ray optics : Synchrotron radiation
(340.7470) X-ray optics : X-ray mirrors

Citation
C. Michaelsen, J. Wiesmann, R. Bormann, C. Nowak, C. Dieker, S. Hollensteiner, and W. Jäger, "Multilayer mirror for x rays below 190 eV," Opt. Lett. 26, 792-794 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-11-792


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. C. Michaelsen, P. Ricardo, D. Anders, M. Schuster, J. Schilling, and H. Göbel, Adv. X-Ray Anal. 42, 308 (2000).
  2. P. Ricardo, J. Wiesmann, C. Nowak, C. Michaelsen, and R. Bormann, “Improved analyzer multilayers for aluminum and boron detection with x-ray fluorescence,” Appl. Opt. (to be published).
  3. http://www-hasylab.desy.de/facility/experimental_stations/stations/G1_XUV_Reflectometer_BUMBLE_BEE.htm.
  4. http://www-cxro.lbl.gov:80/optical_constants.
  5. M. Schuster, L. Müller, K. E. Mauser, and R. Straub, Thin Solid Films 157, 325 (1988).
  6. B. L. Henke, E. M. Gullikson, and J. C. Davis, At. Data Nucl. Data Tables 54, 181 (1993).
  7. http://physics.nist.gov/PhysRefData/FFast/Text/cover.html.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited