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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 26, Iss. 14 — Jul. 15, 2001
  • pp: 1072–1074

Three-dimensional total internal reflection microscopy

P. Scott Carney and John C. Schotland  »View Author Affiliations


Optics Letters, Vol. 26, Issue 14, pp. 1072-1074 (2001)
http://dx.doi.org/10.1364/OL.26.001072


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Abstract

We investigate the inverse-scattering problem that arises in total internal reflection microscopy. An analytic solution to this problem within the weak-scattering approximation is used to develop a novel form of three-dimensional microscopy with subwavelength resolution.

© 2001 Optical Society of America

OCIS Codes
(100.3010) Image processing : Image reconstruction techniques
(180.6900) Microscopy : Three-dimensional microscopy
(290.3200) Scattering : Inverse scattering

Citation
P. Scott Carney and John C. Schotland, "Three-dimensional total internal reflection microscopy," Opt. Lett. 26, 1072-1074 (2001)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-26-14-1072

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