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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 27, Iss. 1 — Jan. 1, 2002
  • pp: 25–27

Direction-sensitive subwavelength displacement measurements at diffraction-limited spatial resolution

Peter John Rodrigo, May Lim, and Caesar Saloma  »View Author Affiliations


Optics Letters, Vol. 27, Issue 1, pp. 25-27 (2002)
http://dx.doi.org/10.1364/OL.27.000025


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Abstract

Direction-sensitive displacement measurements at diffraction-limited spatial resolution are demonstrated with an interferometric optical-feedback semiconductor laser confocal imaging system. Subwavelength axial movements of the reflecting sample, including the directions of motion, are detected within the depth of field. A comparison of theory and actual instrument performance is presented.

© 2002 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.7250) Instrumentation, measurement, and metrology : Velocimetry
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis
(140.5960) Lasers and laser optics : Semiconductor lasers

Citation
Peter John Rodrigo, May Lim, and Caesar Saloma, "Direction-sensitive subwavelength displacement measurements at diffraction-limited spatial resolution," Opt. Lett. 27, 25-27 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-1-25


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References

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