Direction-sensitive displacement measurements at diffraction-limited spatial resolution are demonstrated with an interferometric optical-feedback semiconductor laser confocal imaging system. Subwavelength axial movements of the reflecting sample, including the directions of motion, are detected within the depth of field. A comparison of theory and actual instrument performance is presented.
© 2002 Optical Society of America
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.7250) Instrumentation, measurement, and metrology : Velocimetry
(120.7280) Instrumentation, measurement, and metrology : Vibration analysis
(140.5960) Lasers and laser optics : Semiconductor lasers
Peter John Rodrigo, May Lim, and Caesar Saloma, "Direction-sensitive subwavelength displacement measurements at diffraction-limited spatial resolution," Opt. Lett. 27, 25-27 (2002)