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Optics Letters

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  • Vol. 27, Iss. 13 — Jul. 1, 2002
  • pp: 1183–1185

Characterization of T-ray binary lenses

S. Wang, T. Yuan, E.D. Walsby, R. J. Blaikie, S. M. Durbin, D. R. S. Cumming, J. Xu, and X.-C. Zhang  »View Author Affiliations


Optics Letters, Vol. 27, Issue 13, pp. 1183-1185 (2002)
http://dx.doi.org/10.1364/OL.27.001183


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Abstract

Multilevel phase-shift Fresnel diffractive zone plates fabricated on silicon wafers have been used as T-ray imaging lenses. The imaging results, including spatial and temporal distribution of T-rays measured at the focal planes in the frequency range from 0.5 to 1.5 THz, indicate that the performance of the diffractive terahertz (THz) lens is comparable with or better than that of conventional refractive THz lenses. The unique properties of the T-ray binary lens make it possible to fabricate excellent optics for narrow-band THz applications.

© 2002 Optical Society of America

OCIS Codes
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(320.7080) Ultrafast optics : Ultrafast devices
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7110) Ultrafast optics : Ultrafast nonlinear optics
(320.7150) Ultrafast optics : Ultrafast spectroscopy
(320.7160) Ultrafast optics : Ultrafast technology

Citation
S. Wang, T. Yuan, E.D. Walsby, R. J. Blaikie, S. M. Durbin, D. R. S. Cumming, J. Xu, and X.-C. Zhang, "Characterization of T-ray binary lenses," Opt. Lett. 27, 1183-1185 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-13-1183


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