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Optics Letters

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  • Vol. 27, Iss. 8 — Apr. 15, 2002
  • pp: 646–648

Photonic crystal sensor based on surface waves for thin-film characterization

F. Villa, L. E. Regalado, F. Ramos-Mendieta, J. Gaspar-Armenta, and T. Lopez-Ríos  »View Author Affiliations


Optics Letters, Vol. 27, Issue 8, pp. 646-648 (2002)
http://dx.doi.org/10.1364/OL.27.000646


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Abstract

A new sensor based on optical surface waves in truncated one-dimensional photonic crystals is proposed for use in determining the optical properties of metallic or dielectric thin films and bulk media. Specifically, the method of optical characterization takes into account the changes that the surface waves of a layered structure undergo when either a thin film of arbitrary material is added at the surface or the optical properties of transmission medium change. For the surface-wave excitation the Kretschmann configuration used in attenuated total reflectance is employed.

© 2002 Optical Society of America

OCIS Codes
(230.4110) Optical devices : Modulators
(240.0240) Optics at surfaces : Optics at surfaces
(240.0310) Optics at surfaces : Thin films
(240.6680) Optics at surfaces : Surface plasmons
(240.6690) Optics at surfaces : Surface waves
(310.0310) Thin films : Thin films

Citation
F. Villa, L. E. Regalado, F. Ramos-Mendieta, J. Gaspar-Armenta, and T. Lopez-Ríos, "Photonic crystal sensor based on surface waves for thin-film characterization," Opt. Lett. 27, 646-648 (2002)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-27-8-646


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References

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