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Optics Letters

Optics Letters


  • Vol. 28, Iss. 12 — Jun. 15, 2003
  • pp: 1049–1051

Imaging and quality assessment of high-harmonic focal spots

C. Valentin, D. Douillet, S. Kazamias, Th. Lefrou, G. Grillon, F. Augé, G. Mullot, Ph. Balcou, P. Mercère, and Ph. Zeitoun  »View Author Affiliations

Optics Letters, Vol. 28, Issue 12, pp. 1049-1051 (2003)

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We present a direct method of studying the focusability of an intense, short-pulse extreme-ultraviolet (XUV) beam obtained by high-harmonic generation. We perform near-field imaging of the focal spot of five high-harmonic orders strongly focused by a broadband toroidal mirror. To visualize the focal spot directly, we image the fluorescence induced by an XUV beam on a cerium-doped YAG crystal on a visible CCD camera. We can thus measure the harmonic spot size on a single image, together with the Strehl ratio, to evaluate the quality of focusing. Such techniques should become instrumental in optimizing the focusing conditions and reaching intensities required for exploring attosecond nonlinear optics in the XUV range.

© 2003 Optical Society of America

OCIS Codes
(020.0020) Atomic and molecular physics : Atomic and molecular physics
(190.0190) Nonlinear optics : Nonlinear optics
(190.4160) Nonlinear optics : Multiharmonic generation
(190.7110) Nonlinear optics : Ultrafast nonlinear optics
(320.7110) Ultrafast optics : Ultrafast nonlinear optics
(340.0340) X-ray optics : X-ray optics

C. Valentin, D. Douillet, S. Kazamias, Th. Lefrou, G. Grillon, F. Augé, G. Mullot, Ph. Balcou, P. Mercère, and Ph. Zeitoun, "Imaging and quality assessment of high-harmonic focal spots," Opt. Lett. 28, 1049-1051 (2003)

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