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Optics Letters

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  • Vol. 28, Iss. 13 — Jul. 1, 2003
  • pp: 1099–1101

Development of an optical refractometer by analysis of one-dimensional photonic bandgap structures with defects

Ignacio R. Matías, Ignacio Del Villar, Francisco J. Arregui, and Richard O. Claus  »View Author Affiliations


Optics Letters, Vol. 28, Issue 13, pp. 1099-1101 (2003)
http://dx.doi.org/10.1364/OL.28.001099


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Abstract

A theoretical analysis of an optical fiber photonic-bandgap-based refractometer is presented. The design is based on a quarter-wave reflector with one defect. By modifying both the real and the imaginary parts of the index of refraction of the defects we begin to change either the frequency or the amplitude of the localized optical mode. So we could fabricate a specific optical fiber refractometer by combining all the variables: index of refractive index of the defects and the rest of layers, thickness of the defect, number of layers, etc. to yield a large set of design possibilities, for example, detecting wider or thinner ranges of refractive indices, or controlling the detection accuracy. Some rules for the practical implementation of the refractometer are given.

© 2003 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(050.2770) Diffraction and gratings : Gratings
(060.2310) Fiber optics and optical communications : Fiber optics
(310.6860) Thin films : Thin films, optical properties

Citation
Ignacio R. Matías, Ignacio Del Villar, Francisco J. Arregui, and Richard O. Claus, "Development of an optical refractometer by analysis of one-dimensional photonic bandgap structures with defects," Opt. Lett. 28, 1099-1101 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-13-1099


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References

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