Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation
Optics Letters, Vol. 28, Issue 16, pp. 1445-1447 (2003)
http://dx.doi.org/10.1364/OL.28.001445
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Abstract
We measure the susceptibility components of a poled polymer film by second-harmonic generation with two beams at the fundamental frequency. The technique allows the consistency of experimental data and the validity of the theoretical model used to analyze the results to be addressed. Our results are in agreement with the expected values, provided that the linear optical properties of the sample are properly included.
© 2003 Optical Society of America
OCIS Codes
(190.0190) Nonlinear optics : Nonlinear optics
(310.6860) Thin films : Thin films, optical properties
Citation
Stefano Cattaneo and Martti Kauranen, "Determination of second-order susceptibility components of thin films by two-beam second-harmonic generation," Opt. Lett. 28, 1445-1447 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-16-1445
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