Abstract
Using the nanometer depth sensitivity of differential confocal microscopy, we detect surface features of lateral dimensions smaller than the diffraction limit without fluorescence labeling. The lateral resolution of the topographic images is further enhanced by a maximum-likelihood estimation algorithm. Based on the comparison of signal and noise at high spatial frequency, we estimate the best lateral resolution of the enhanced images to be . In addition, on composite samples this technique can simultaneously display sub-diffraction-limit topographic features and reflectivity heterogeneity.
© 2003 Optical Society of America
Full Article | PDF ArticleMore Like This
Jim Swoger, Jan Huisken, and Ernst H. K. Stelzer
Opt. Lett. 28(18) 1654-1656 (2003)
Rongji Li, Demin Xu, Angze Li, Yunhao Su, Weiqian Zhao, Lirong Qiu, and Han Cui
Opt. Express 30(23) 41447-41458 (2022)
DongKyun Kang and DaeGab Gweon
Opt. Lett. 28(24) 2470-2472 (2003)