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Optics Letters

Optics Letters

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  • Vol. 28, Iss. 19 — Oct. 1, 2003
  • pp: 1778–1780

Measurement of birefringence in thin-film waveguides by Rayleigh scattering

S. Janz, P. Cheben, H. Dayan, and R. Deakos  »View Author Affiliations


Optics Letters, Vol. 28, Issue 19, pp. 1778-1780 (2003)
http://dx.doi.org/10.1364/OL.28.001778


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Abstract

A method of measuring birefringence in slab and ridge waveguides based on the coherent superposition of Rayleigh light scattering from TE and TM polarized modes is described and demonstrated in silica-on-silicon waveguides. A measurement accuracy of approximately 10<sup>-6</sup> has been achieved. This method is used to determine the evolution of waveguide birefringence with annealing temperature in phosphorous-doped glass waveguides. The measured birefringence increases rapidly with annealing temperatures up to 800 °C but remains unchanged for higher-temperature anneals. We interpret this threshold as the temperature above which glass can flow.

© 2003 Optical Society of America

OCIS Codes
(130.2790) Integrated optics : Guided waves
(130.3130) Integrated optics : Integrated optics materials
(160.6030) Materials : Silica
(220.4840) Optical design and fabrication : Testing

Citation
S. Janz, P. Cheben, H. Dayan, and R. Deakos, "Measurement of birefringence in thin-film waveguides by Rayleigh scattering," Opt. Lett. 28, 1778-1780 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-19-1778

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