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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 28, Iss. 22 — Nov. 15, 2003
  • pp: 2147–2149

Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling

Radouane Fikri, Thomas Grosges, and Dominique Barchiesi  »View Author Affiliations


Optics Letters, Vol. 28, Issue 22, pp. 2147-2149 (2003)
http://dx.doi.org/10.1364/OL.28.002147


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Abstract

In apertureless scanning near-field optical microscopy (ASNOM), the probe vibration is often used to increase the detected signal. The useful signal is detected at the probe-vibration frequency by a lock-in amplifier. By comparing two-dimensional numerical results with an experimental scan, we show numerically that, to explain or predict the detected signal, a realistic model of ASNOM should take into account the scan of the probe as well as the probe vibration and the material properties.

© 2003 Optical Society of America

OCIS Codes
(180.5810) Microscopy : Scanning microscopy
(260.2110) Physical optics : Electromagnetic optics

Citation
Radouane Fikri, Thomas Grosges, and Dominique Barchiesi, "Apertureless scanning near-field optical microscopy: the need for probe-vibration modeling," Opt. Lett. 28, 2147-2149 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-22-2147

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