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Optics Letters

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  • Vol. 28, Iss. 24 — Dec. 15, 2003
  • pp: 2479–2481

Resolution enhancement of ¯pHe+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter

Masaki Hori, Ryugo S. Hayano, Eberhard Widmann, and Hiroyuki A. Torii  »View Author Affiliations


Optics Letters, Vol. 28, Issue 24, pp. 2479-2481 (2003)
http://dx.doi.org/10.1364/OL.28.002479


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Abstract

A Fizeau wavelength meter was used to compensate for fluctuations in the longitudinal mode structure and wavelength of a pulsed dye laser. The average laser linewidth was effectively narrowed by selection of laser pulses with a single longitudinal mode. These techniques were recently employed to measure some atomic transition wavelengths in ¯pHe + to fractional precisions greater than 1 part in 107. The wavelengths were absolutely calibrated against iodine or tellurium lines by absorption spectroscopy or against neon or argon lines by optogalvanic spectroscopy.

© 2003 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.3600) Lasers and laser optics : Lasers, tunable
(300.6210) Spectroscopy : Spectroscopy, atomic
(300.6360) Spectroscopy : Spectroscopy, laser

Citation
Masaki Hori, Ryugo S. Hayano, Eberhard Widmann, and Hiroyuki A. Torii, "Resolution enhancement of ¯pHe+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter," Opt. Lett. 28, 2479-2481 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-24-2479


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