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Resolution enhancement of p¯He+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter

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Abstract

A Fizeau wavelength meter was used to compensate for fluctuations in the longitudinal mode structure and wavelength of a pulsed dye laser. The average laser linewidth was effectively narrowed by selection of laser pulses with a single longitudinal mode. These techniques were recently employed to measure some atomic transition wavelengths in p¯He+ to fractional precisions greater than 1 part in 107. The wavelengths were absolutely calibrated against iodine or tellurium lines by absorption spectroscopy or against neon or argon lines by optogalvanic spectroscopy.

© 2003 Optical Society of America

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