Resolution enhancement of ¯pHe+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter
Optics Letters, Vol. 28, Issue 24, pp. 2479-2481 (2003)
http://dx.doi.org/10.1364/OL.28.002479
Acrobat PDF (1289 KB)
Abstract
A Fizeau wavelength meter was used to compensate for fluctuations in the longitudinal mode structure and wavelength of a pulsed dye laser. The average laser linewidth was effectively narrowed by selection of laser pulses with a single longitudinal mode. These techniques were recently employed to measure some atomic transition wavelengths in ¯pHe + to fractional precisions greater than 1 part in 107. The wavelengths were absolutely calibrated against iodine or tellurium lines by absorption spectroscopy or against neon or argon lines by optogalvanic spectroscopy.
© 2003 Optical Society of America
OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.3600) Lasers and laser optics : Lasers, tunable
(300.6210) Spectroscopy : Spectroscopy, atomic
(300.6360) Spectroscopy : Spectroscopy, laser
Citation
Masaki Hori, Ryugo S. Hayano, Eberhard Widmann, and Hiroyuki A. Torii, "Resolution enhancement of ¯pHe+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter," Opt. Lett. 28, 2479-2481 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-24-2479
You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
You do not have subscription access to this journal. Article level metrics are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Log in to access OSA Member Subscription
Related Journal Articles 
- Speckle photography with different pupils in a multiple-exposure scheme (JOSAA)
- Generalized algorithm for the unified analysis and simultaneous evaluation of geometrical spin-redirection phase and Pancharatnam phase in a complex interferometric system (JOSAA)
- Multilocalization and the van Cittert–Zernike theorem. 1. Theory (JOSAA)
- Calibration of a Computer-Controlled Precision Wavemeter for Use with Pulsed Lasers (AO)
- Modulation-free sub-Doppler laser frequency stabilization to molecular iodine with a common-path, two-color interferometer (OE)
Related Conference Papers
- Two Methods for Remote Measurements of Thermal Effects in Optical Elements
- Intracavity laser absorption spectroscopy and Cavity Ring-Down Spectroscopy in low pressure flames. Comparison and perspectives.
- Ultrafast Wavelength-Swept Lasers
- Advanced Length Metrology Exploiting the Frequency Comb of a Femtosecond Laser
- Advanced Length Metrology Exploiting the Frequency Comb of a Femtosecond Laser
« Previous Article | Next Article »
OSA is a member of 