A Fizeau wavelength meter was used to compensate for fluctuations in the longitudinal mode structure and wavelength of a pulsed dye laser. The average laser linewidth was effectively narrowed by selection of laser pulses with a single longitudinal mode. These techniques were recently employed to measure some atomic transition wavelengths in <i>¯p</i>He <sup>+</sup> to fractional precisions greater than 1 part in 10<sup>7</sup>. The wavelengths were absolutely calibrated against iodine or tellurium lines by absorption spectroscopy or against neon or argon lines by optogalvanic spectroscopy.
© 2003 Optical Society of America
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(140.3600) Lasers and laser optics : Lasers, tunable
(300.6210) Spectroscopy : Spectroscopy, atomic
(300.6360) Spectroscopy : Spectroscopy, laser
Masaki Hori, Ryugo S. Hayano, Eberhard Widmann, and Hiroyuki A. Torii, "Resolution enhancement of ¯pHe+ atomic line profiles measured with a pulsed dye laser and a Fizeau wavelength meter," Opt. Lett. 28, 2479-2481 (2003)