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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 28, Iss. 24 — Dec. 15, 2003
  • pp: 2530–2530

20-nm-resolution soft x-ray microscopy demonstrated by use of multilayer test structures: erratum

Weilun Chao, Erik Anderson, Gregory P. Denbeaux, Bruce Harteneck, J. Alexander Liddle, Deirdre L. Olynick, Angelic L. Pearson, Farhad Salmassi, ChengYu Song, and David T. Attwood  »View Author Affiliations


Optics Letters, Vol. 28, Issue 24, pp. 2530-2530 (2003)
http://dx.doi.org/10.1364/OL.28.002530


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No abstract available.

OCIS Codes
(110.4980) Imaging systems : Partial coherence in imaging
(180.7460) Microscopy : X-ray microscopy
(340.7460) X-ray optics : X-ray microscopy

Citation
Weilun Chao, Erik Anderson, Gregory P. Denbeaux, Bruce Harteneck, J. Alexander Liddle, Deirdre L. Olynick, Angelic L. Pearson, Farhad Salmassi, ChengYu Song, and David T. Attwood, "20-nm-resolution soft x-ray microscopy demonstrated by use of multilayer test structures: erratum," Opt. Lett. 28, 2530-2530 (2003)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-28-24-2530


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