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Optics Letters

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  • Vol. 29, Iss. 10 — May. 14, 2004
  • pp: 1045–1047

Characterization of the signature of subwavelength variation from far-field irradiance

Shu-Chun Chu and Jyh-Long Chern  »View Author Affiliations


Optics Letters, Vol. 29, Issue 10, pp. 1045-1047 (2004)
http://dx.doi.org/10.1364/OL.29.001045


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Abstract

The dynamic signature of the subwavelength variation of a slit is shown to be determinable from far-field irradiance with a precision of better than 1 nm. One can increase the efficiency of measurement of the subwavelength’s signature by adjusting the detection width over which the subwavelength variation is detected. The subwavelength variation of a rectangular aperture was also examined to show the general feasibility.

© 2004 Optical Society of America

OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(120.1880) Instrumentation, measurement, and metrology : Detection

Citation
Shu-Chun Chu and Jyh-Long Chern, "Characterization of the signature of subwavelength variation from far-field irradiance," Opt. Lett. 29, 1045-1047 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-10-1045


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References

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  9. Ref. 7, p. 74.
  10. In the simulation, only a simple time-difference approximation was used to derive the width of the slit from the rate of its variation: a(t+Dt)=a(t)+(da/dt)=a (t)×Dt.
  11. A high-speed detector that can operate at up to 25 GHz is commerically available; see http://www.newfocus.com/support/manuals/detectors_manuals.cfm.
  12. Commercial high-performance optical meters can detect powers of as much as ~100 fW ; see http://www.newport.com/store/catalogmap.asp.

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