Characterization of the signature of subwavelength variation from far-field irradiance
Optics Letters, Vol. 29, Issue 10, pp. 1045-1047 (2004)
http://dx.doi.org/10.1364/OL.29.001045
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Abstract
The dynamic signature of the subwavelength variation of a slit is shown to be determinable from far-field irradiance with a precision of better than 1 nm. One can increase the efficiency of measurement of the subwavelength’s signature by adjusting the detection width over which the subwavelength variation is detected. The subwavelength variation of a rectangular aperture was also examined to show the general feasibility.
© 2004 Optical Society of America
OCIS Codes
(050.1940) Diffraction and gratings : Diffraction
(070.2580) Fourier optics and signal processing : Paraxial wave optics
(120.1880) Instrumentation, measurement, and metrology : Detection
Citation
Shu-Chun Chu and Jyh-Long Chern, "Characterization of the signature of subwavelength variation from far-field
irradiance," Opt. Lett. 29, 1045-1047 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-10-1045
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