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Optics Letters

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  • Vol. 29, Iss. 11 — Jun. 1, 2004
  • pp: 1279–1281

Sampling measurement of soft-x-ray-pulse shapes by femtosecond sequential ionization of Kr+ in an intense laser field

Katsuya Oguri, Tadashi Nishikawa, Tsuneyuki Ozaki*, and Hidetoshi Nakano  »View Author Affiliations


Optics Letters, Vol. 29, Issue 11, pp. 1279-1281 (2004)
http://dx.doi.org/10.1364/OL.29.001279


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Abstract

We propose a sampling technique for measuring the shape of ultrashort soft-x-ray pulses. The technique uses the transient state of Kr<sup>+</sup> ions that is produced by the femtosecond sequential evolution of Kr ions during optical-field-induced ionization as an ultrafast x-ray-absorption sampling gate. We demonstrate the technique by measuring the pulse shape of the 51st harmonic (15.6 nm) generated by a 100-fs titanium:sapphire laser pulse. The measured pulse duration is 220 fs. Our experimental result confirms that the sequential evolution of Kr<sup>+</sup> ions from neutral Kr to Kr<sup>2+</sup> is the dominant contribution to the ionization process from the aspect of time-domain measurement.

© 2004 Optical Society of America

OCIS Codes
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

Citation
Katsuya Oguri, Tadashi Nishikawa, Tsuneyuki Ozaki*, and Hidetoshi Nakano, "Sampling measurement of soft-x-ray-pulse shapes by femtosecond sequential ionization of Kr+ in an intense laser field," Opt. Lett. 29, 1279-1281 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-11-1279


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