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Optics Letters

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  • Vol. 29, Iss. 20 — Oct. 15, 2004
  • pp: 2435–2437

Determining thickness independently from optical constants by use of ultrafast light

Feng Huang, John F. Federici, and Dale Gary  »View Author Affiliations


Optics Letters, Vol. 29, Issue 20, pp. 2435-2437 (2004)
http://dx.doi.org/10.1364/OL.29.002435


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Abstract

We show that the application of ultrafast techniques, especially terahertz time-domain spectroscopy, allows simultaneous measurements of material thickness and optical constants from transmission measurements, by analyzing not only the phase difference between the main terahertz pulse through the medium but also the subsequent multireflection pulse (an echo) from the medium. Such a method provides a fast and precise characterization of the optical properties and can extract thickness information and hence other optical constants in a broad bandwidth. It may have applications in science and engineering such as <i>in situ</i> film thickness and quality monitoring, optical constants measurement, medical imaging, noninvasive detection, and remote sensing.

© 2004 Optical Society of America

OCIS Codes
(120.4530) Instrumentation, measurement, and metrology : Optical constants
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(300.6530) Spectroscopy : Spectroscopy, ultrafast
(320.7100) Ultrafast optics : Ultrafast measurements
(320.7160) Ultrafast optics : Ultrafast technology

Citation
Feng Huang, John F. Federici, and Dale Gary, "Determining thickness independently from optical constants by use of ultrafast light," Opt. Lett. 29, 2435-2437 (2004)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-29-20-2435


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References

  1. D. H. Auston, K. P. Cheung, and P. R. Smith, Appl. Phys. Lett. 45, 284 (1984).
  2. M. van Exter, Ch. Fattinger, and D. Grischkowsky, Appl. Phys. Lett. 55, 337 (1989).
  3. J. Orenstein and A. J. Millis, Science 288, 468 (2000).
  4. E. V. Loewenstein, D. R. Smith, and R. L. Morgan, Appl. Opt. 12, 398 (1973).
  5. E. E. Russell and E. E. Bell, J. Opt. Soc. Am. 57, 341 (1967).
  6. D. Grischokowsky, S. Keiding, M. van Exter, and Ch. Fattinger, J. Opt. Soc. Am. B 7, 2006 (1990).
  7. M. van Exter, Ch. Fattinger, and D. Grischkowsky, Opt. Lett. 14, 1128 (1989).
  8. M. C. Nuss, D. H. Auston, and F. Cappasso, Phys. Rev. Lett. 58, 2355 (1987).
  9. C. M. Randall and R. D. Rawcliffe, Appl. Opt. 6, 1889 (1967).
  10. D. Huang, E. A. Swanson, C. P. Lin, J. S. Schuman, W. G. Stinson, W. Chang, M. R. Hee, T. Flotte, K. Gregory, C. A. Puliafito, and J. G. Fujimoto, Science 254, 1178 (1991).
  11. E. A. Swanson, J. A. Izatt, M. R. Hee, D. Huang, C. A. Puliafito, J. S. Schuman, and J. G. Fujimoto, Opt. Lett. 18, 1864 (1993).
  12. G. J. Tearney, E. Brezinski, B. E. Bouma, S. A. Boppart, C. Pitris, J. F. Southern, and J. G. Fujimoto, Science 276, 2037 (1997).
  13. J. L. Johnson, T. D. Dorney, and D. M. Mittleman, Appl. Phys. Lett. 78, 835 (2001).
  14. K. S. Lee, J. Y. Kim, J. Fortin, Z. P. Jiang, M. Li, T. M. Lu, and X.-C. Zhang, Ultrafast Phenomena XII (Springer, New York, 2000).
  15. T. J. Yen, W. J. Padilla, N. Fang, D. C. Vier, D. R. Smith, J. B. Pendry, D. N. Basov, and X. Zhang, Science 303, 1494 (2004).
  16. L. Duvillaret, F. Garet, and J.-L. Coutaz, Appl. Opt. 38, 409 (1999).
  17. T. D. Dorney, R. G. Baraniuk, and D. M. Mittleman, J. Opt. Soc. Am. A 18, 1562 (2001).
  18. F. Huang, W. Yang, and W. S. Warren, Opt. Lett. 26, 382 (2001).
  19. C. Iaconis and I. A. Walmsley, Opt. Lett. 23, 792 (1998).
  20. E. E. Bell, presented at the Symposium on Molecular Structure and Spectroscopy, Columbus, Ohio, June 14–16, 1962.
  21. J. E. Chamberlin, J. E. Gibbs, and H. A. Gebbie, Nature 198, 874 (1963).
  22. H. C. Kapteyn, M. M. Murnane, and I. P. Christov, X-Ray Lasers 1998: Proceedings of the 6th International Conference on X-Ray Lasers (Institute of Physics, London, 1999), pp. 17–23.
  23. P. Emma, K. Bane, M. Cornacchia, Z. Huang, H. Schlarb, G. Stupakov, and D. Walz, Phys. Rev. Lett. 92, 074801 (2004).
  24. L.-S. Ma, Z. Bi, A. Bartels, L. Robertsson, M. Zucco, R. S. Windeler, G. Wilpers, C. Oates, L. Hollberg, and S. A. Diddams, Science 303, 1843 (2004).

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