Abstract
Analysis and synthesis operations for a stack of dielectric layers with equal optical thickness are described in terms of the Wiener–Khintchine theorem with variables reflectance R and distribution of optical paths f. The method yields an infinite sequence of refractive indices that converge to a substrate index. An iterative process is used to determine the minimum phase solution, and all practical solutions are constructed from it by a root-shifting procedure. Realizability and practicability conditions are discussed.
© 1978 Optical Society of America
Full Article | PDF ArticleMore Like This
J. A. Dobrowolski and D. Lowe
Appl. Opt. 17(19) 3039-3050 (1978)
J. P. Borgogno and E. Pelletier
J. Opt. Soc. Am. 68(7) 964-972 (1978)
C. J. v. d. Laan and H. J. Frankena
Appl. Opt. 17(4) 538-541 (1978)