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Optics Letters

Optics Letters


  • Vol. 30, Iss. 2 — Jan. 15, 2005
  • pp: 204–206

Synchrotron beam coherence: a spatially resolved measurement

C. Q. Tran, A. G. Peele, A. Roberts, K. A. Nugent, D. Paterson, and I. McNulty  »View Author Affiliations

Optics Letters, Vol. 30, Issue 2, pp. 204-206 (2005)

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We report a precise and spatially resolved measurement of the complex degree of coherence of a one-dimensional 1.5-keV beam produced by a third-generation synchrotron source. The method of phase-space tomography is used, which requires only measurements of the x-ray intensity. We find that the field is statistically stationary to within experimental error, the correlations are very well approximated by a Gaussian distribution, and the measured coherence length is in excellent agreement with expectations.

© 2005 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(180.7460) Microscopy : X-ray microscopy
(340.6720) X-ray optics : Synchrotron radiation
(340.7440) X-ray optics : X-ray imaging

C. Q. Tran, A. G. Peele, A. Roberts, K. A. Nugent, D. Paterson, and I. McNulty, "Synchrotron beam coherence: a spatially resolved measurement," Opt. Lett. 30, 204-206 (2005)

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