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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Vol. 30, Iss. 2 — Jan. 15, 2005
  • pp: 204–206

Synchrotron beam coherence: a spatially resolved measurement

C. Q. Tran, A. G. Peele, A. Roberts, K. A. Nugent, D. Paterson, and I. McNulty  »View Author Affiliations


Optics Letters, Vol. 30, Issue 2, pp. 204-206 (2005)
http://dx.doi.org/10.1364/OL.30.000204


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Abstract

We report a precise and spatially resolved measurement of the complex degree of coherence of a one-dimensional 1.5-keV beam produced by a third-generation synchrotron source. The method of phase-space tomography is used, which requires only measurements of the x-ray intensity. We find that the field is statistically stationary to within experimental error, the correlations are very well approximated by a Gaussian distribution, and the measured coherence length is in excellent agreement with expectations.

© 2005 Optical Society of America

OCIS Codes
(030.1640) Coherence and statistical optics : Coherence
(180.7460) Microscopy : X-ray microscopy
(340.6720) X-ray optics : Synchrotron radiation
(340.7440) X-ray optics : X-ray imaging

Citation
C. Q. Tran, A. G. Peele, A. Roberts, K. A. Nugent, D. Paterson, and I. McNulty, "Synchrotron beam coherence: a spatially resolved measurement," Opt. Lett. 30, 204-206 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-2-204

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