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Optics Letters

Optics Letters

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  • Vol. 30, Iss. 7 — Apr. 1, 2005
  • pp: 711–713

Sapphire-fiber-based white-light interferometric sensor for high-temperature measurements

Yizheng Zhu, Zhengyu Huang, Fabin Shen, and Anbo Wang  »View Author Affiliations


Optics Letters, Vol. 30, Issue 7, pp. 711-713 (2005)
http://dx.doi.org/10.1364/OL.30.000711


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Abstract

We present a fiber-optic temperature sensor with a single-crystal sapphire fiber as the light guide and a sapphire wafer as the sensing element. Temperature is determined by measurement of the thermal dependence of the wafer's optical thickness by use of white-light interferometry. We applied digital signal processing techniques to analyze the sensor's spectrum. A prototype sensor was tested to 1600 °C and demonstrated excellent reproducibility. An accuracy of ±0.2% full scale was obtained. The sensor is simple, small, and flexible, with potential advantages of batch fabrication and easy calibration.

© 2005 Optical Society of America

OCIS Codes
(060.2370) Fiber optics and optical communications : Fiber optics sensors
(120.6780) Instrumentation, measurement, and metrology : Temperature

Citation
Yizheng Zhu, Zhengyu Huang, Fabin Shen, and Anbo Wang, "Sapphire-fiber-based white-light interferometric sensor for high-temperature measurements," Opt. Lett. 30, 711-713 (2005)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-30-7-711

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