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Characterization of a second-order nonlinear layer profile in thermally poled optical fibers with second-harmonic microscopy

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Abstract

Second-harmonic microscopy has been successfully applied to characterize the second-order nonlinear layer in optical fibers thermally poled at 280 °C and 3.5 kV for 30 min. The nonlinear layer was found to be 5.1μm deep under the anode and was not always centered about the closest point between the electrodes.

© 2005 Optical Society of America

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