Abstract

Goos–Hänchen shifts are investigated when total reflection occurs at the interfaces associated with single-negative materials (SNMs). A general rule for judging the direction of the Goos–Hänchen lateral shift concerning lossless media is obtained: Whether the lateral shift is positive or negative depends on the sign of ${\mu }_1{\mu }_2$ for TE-polarized incident beams and ${\epsilon }_1{\epsilon }_2$ for TM-polarized incident beams. It was theoretically demonstrated that, at the interface associated with SNMs, TE- and TM-polarized incident beams experience opposite Goos–Hänchen lateral shifts. An effective and simple approach to discriminating ε-negative material and μ-negative material is proposed.

© 2005 Optical Society of America

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