Frequency-comb-based interferometer for profilometry and tomography
Optics Letters, Vol. 31, Issue 13, pp. 1976-1978 (2006)
http://dx.doi.org/10.1364/OL.31.001976
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Abstract
A novel interferometry technique using a frequency-comb light source is proposed for surface profilometry and tomography of discontinuous objects. Surface profile measurement is performed by sweeping the comb interval frequency without mechanical scanning. Step heights of 0.5 and
© 2006 Optical Society of America
OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(170.4500) Medical optics and biotechnology : Optical coherence tomography
(170.6960) Medical optics and biotechnology : Tomography
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: January 4, 2006
Revised Manuscript: April 6, 2006
Manuscript Accepted: April 8, 2006
Virtual Issues
Vol. 1, Iss. 8 Virtual Journal for Biomedical Optics
Citation
Samuel Choi, Mitsufumi Yamamoto, Daisuke Moteki, Tatsutoshi Shioda, Yosuke Tanaka, and Takashi Kurokawa, "Frequency-comb-based interferometer for profilometry and tomography," Opt. Lett. 31, 1976-1978 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-13-1976
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