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Optics Letters

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  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 18 — Sep. 15, 2006
  • pp: 2765–2767

Nonlinear imaging of embedded microstructures inside transparent materials with laser-induced ionization microscopy

Y. Zhao, G. Mu, and X. Zhu  »View Author Affiliations


Optics Letters, Vol. 31, Issue 18, pp. 2765-2767 (2006)
http://dx.doi.org/10.1364/OL.31.002765


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Abstract

We present a novel nonlinear imaging method that utilizes femtosecond laser-induced plasma emission to probe microscopic structures embedded inside transparent materials. This nonlinear diagnostic tool can resolve either elemental or structural variations of the sample of interest and provide significant improvements over the ordinary linear microscopes by having much higher contrast ratios for the observed areas of different refractive indices. Examples of using this technique to examine the microstructures fabricated by ultrashort laser pulses inside optical glass are presented.

© 2006 Optical Society of America

OCIS Codes
(180.0180) Microscopy : Microscopy
(220.4610) Optical design and fabrication : Optical fabrication
(320.2250) Ultrafast optics : Femtosecond phenomena
(320.7110) Ultrafast optics : Ultrafast nonlinear optics

ToC Category:
Microscopy

History
Original Manuscript: May 15, 2006
Manuscript Accepted: June 21, 2006
Published: August 25, 2006

Virtual Issues
Vol. 1, Iss. 10 Virtual Journal for Biomedical Optics

Citation
Y. Zhao, G. Mu, and X. Zhu, "Nonlinear imaging of embedded microstructures inside transparent materials with laser-induced ionization microscopy," Opt. Lett. 31, 2765-2767 (2006)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-31-18-2765


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