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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 31, Iss. 9 — May. 1, 2006
  • pp: 1220–1222

Three-dimensional particle imaging by wavefront sensing

Catherine E. Towers, David P. Towers, Heather I. Campbell, Sijiong Zhang, and Alan H. Greenaway  »View Author Affiliations

Optics Letters, Vol. 31, Issue 9, pp. 1220-1222 (2006)

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We present two methods for three-dimensional particle metrology from a single two-dimensional view. The techniques are based on wavefront sensing where the three-dimensional location of a particle is encoded into a single image plane. The first technique is based on multiplanar imaging, and the second produces three-dimensional location information via anamorphic distortion of the recorded images. Preliminary results show that an uncertainty of 8 μ m in depth can be obtained for low-particle density over a thin plane, and an uncertainty of 30 μ m for higher particle density over a 10 mm deep volume.

© 2006 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.7250) Instrumentation, measurement, and metrology : Velocimetry

ToC Category:
Instrumentation, Measurement, and Metrology

Original Manuscript: November 29, 2005
Revised Manuscript: January 23, 2006
Manuscript Accepted: February 5, 2006

Catherine E. Towers, David P. Towers, Heather I. Campbell, Sijiong Zhang, and Alan H. Greenaway, "Three-dimensional particle imaging by wavefront sensing," Opt. Lett. 31, 1220-1222 (2006)

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