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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 11 — Jun. 1, 2007
  • pp: 1578–1580

Nanometer-thick Au-films as antireflection coating for infrared light

B. Gompf, J. Beister, T. Brandt, J. Pflaum, and M. Dressel  »View Author Affiliations


Optics Letters, Vol. 32, Issue 11, pp. 1578-1580 (2007)
http://dx.doi.org/10.1364/OL.32.001578


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Abstract

The optical properties of ultrathin Au films on silicon have been studied in the infrared over a wide frequency range from 200 to 10,000 cm 1 . Thick films show a Drude behavior; i.e., with increasing frequency the transmission increases; for films below the percolation threshold at about 5 nm a negative slope for the frequency-dependent transmission is observed. When the thickness is further reduced, between 1 and 3 nm an anomaly occurs: the relative transmission reaches maximum values above 100% compared with the bare substrate, indicating an antireflection coating of nanometer thickness for light of 5 μ m wavelength. This anomaly can be explained in the framework of effective-medium theories.

© 2007 Optical Society of America

OCIS Codes
(260.3060) Physical optics : Infrared
(260.3910) Physical optics : Metal optics
(310.1210) Thin films : Antireflection coatings

ToC Category:
Physical Optics

History
Original Manuscript: February 2, 2007
Revised Manuscript: March 7, 2007
Manuscript Accepted: March 30, 2007
Published: May 18, 2007

Citation
B. Gompf, J. Beister, T. Brandt, J. Pflaum, and M. Dressel, "Nanometer-thick Au-films as antireflection coating for infrared light," Opt. Lett. 32, 1578-1580 (2007)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-32-11-1578

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