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Optics Letters

Optics Letters


  • Editor: Anthony J. Campillo
  • Vol. 32, Iss. 21 — Nov. 1, 2007
  • pp: 3062–3064

Thin-film-based sensitivity enhancement for total internal reflection fluorescence live-cell imaging

Kyujung Kim, Eun-Jin Cho, Yong-Min Huh, and Donghyun Kim  »View Author Affiliations

Optics Letters, Vol. 32, Issue 21, pp. 3062-3064 (2007)

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We investigated experimentally the evanescent field enhancement based on dielectric thin films in total internal reflection microscopy. The sample employed two layers of Al 2 O 3 and Si O 2 deposited on an SF10 glass substrate. Field intensity enhancement measured by fluorescent excitation of microbeads relative to that of a control sample without dielectric films was polarization dependent, determined as 4.2 and 2.4 for TE and TM polarizations, respectively, and was in good agreement with numerical results. The thin-film-based field enhancement was also applied to live-cell imaging of quantum dots, which confirmed the sensitivity enhancement qualitatively.

© 2007 Optical Society of America

OCIS Codes
(170.3880) Medical optics and biotechnology : Medical and biological imaging
(180.2520) Microscopy : Fluorescence microscopy
(240.0310) Optics at surfaces : Thin films
(260.6970) Physical optics : Total internal reflection

ToC Category:
Physical Optics

Original Manuscript: July 30, 2007
Revised Manuscript: September 11, 2007
Manuscript Accepted: September 14, 2007
Published: October 15, 2007

Virtual Issues
Vol. 2, Iss. 12 Virtual Journal for Biomedical Optics

Kyujung Kim, Eun-Jin Cho, Yong-Min Huh, and Donghyun Kim, "Thin-film-based sensitivity enhancement for total internal reflection fluorescence live-cell imaging," Opt. Lett. 32, 3062-3064 (2007)

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