We measured linear and quadratic dispersion on millimeter-length fibers, waveguides, and nanowires based on common-path spectral interferometry. We obtained the linear dispersion parameter,
, with a relative precision of
, and extracted the quadratic dispersion parameter,
, from the Taylor expansion of
values show a discrepancy of
when compared with simulation as well as with measurement results obtained by a conventional Michelson interferometer. Using this method, we experimentally confirmed the sign inversion of the group velocity dispersion of
nanowires for what is believed to be the first time.
© 2007 Optical Society of America
(120.2230) Instrumentation, measurement, and metrology : Fabry-Perot
(120.3180) Instrumentation, measurement, and metrology : Interferometry
Instrumentation, Measurement, and Metrology
Original Manuscript: July 10, 2007
Revised Manuscript: September 29, 2007
Manuscript Accepted: September 30, 2007
Published: November 6, 2007
W. Mohammed, J. Meier, M. Galle, L. Qian, J. S. Aitchison, and P. W. E. Smith, "Linear and quadratic dispersion characterization of millimeter-length fibers and waveguides using common-path interferometry," Opt. Lett. 32, 3312-3314 (2007)
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