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Optics Letters

Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 33, Iss. 21 — Nov. 1, 2008
  • pp: 2527–2529

Realization of a near-perfect antireflection coating for silicon solar energy utilization

Mei-Ling Kuo, David J. Poxson, Yong Sung Kim, Frank W. Mont, Jong Kyu Kim, E. Fred Schubert, and Shawn-Yu Lin

Optics Letters, Vol. 33, Issue 21, pp. 2527-2529        doi:10.1364/OL.33.002527

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  • OCIS Codes:
  • (350.6050) Other areas of optics : Solar energy
  • (220.4241) Optical design and fabrication : Nanostructure fabrication
ToC Category:
Optical Design and Fabrication

Citation
Mei-Ling Kuo, David J. Poxson, Yong Sung Kim, Frank W. Mont, Jong Kyu Kim, E. Fred Schubert, and Shawn-Yu Lin, "Realization of a near-perfect antireflection coating for silicon solar energy utilization," Opt. Lett. 33, 2527-2529 (2008)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-33-21-2527

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Abstract

To harness the full spectrum of solar energy, Fresnel reflection at the surface of a solar cell must be eliminated over the entire solar spectrum and at all angles. Here, we show that a multilayer nanostructure having a graded-index profile, as predicted by theory [J. Opt. Soc. Am. 66, 515 (1976); Appl. Opt. 46, 6533 (2007)], can accomplish a near-perfect transmission of all-color of sunlight. An ultralow total reflectance of 1%-6% has been achieved over a broad spectrum, λ=400to1600 nm, and a wide range of angles of incidence, θ=0°-60°. The measured angle- and wavelength-averaged total reflectance of 3.79% is the smallest ever reported in the literature, to our knowledge.

© 2008 Optical Society of America

» View Full Text: Acrobat PDF (306 KB)

History
Original Manuscript: June 12, 2008
Manuscript Accepted: September 9, 2008
Revised Manuscript: August 20, 2008
Published: October 29, 2008

References

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Author Affiliations

Mei-Ling Kuo, David J. Poxson, Yong Sung Kim, Frank W. Mont, Jong Kyu Kim, E. Fred Schubert, Shawn-Yu Lin

Rensselaer Polytechnic Institute

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