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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 33, Iss. 23 — Dec. 1, 2008
  • pp: 2794–2796

Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination

Xiang Yu, Yukihiro Araki, Kentaro Iwami, and Norihiro Umeda  »View Author Affiliations

Optics Letters, Vol. 33, Issue 23, pp. 2794-2796 (2008)

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The size of a particle smaller than the diffraction limit is measured using a conventional optical microscope by adopting a standing evanescent field illumination. The scattering intensity from a nanoparticle is periodically modulated by shifting the intensity fringes of the standing evanescent field. By measuring contrast of scattering intensity variation during one cycle of modulation, particle sizes can be estimated easily. Furthermore, material dependence can be canceled using contrast as an evaluation factor. From the experimental results, particle sizes ranging from 20   to   250 nm are successfully determined. This technique offers a low-cost size measurement for nanoparticles.

© 2008 Optical Society of America

OCIS Codes
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.4630) Instrumentation, measurement, and metrology : Optical inspection
(120.5060) Instrumentation, measurement, and metrology : Phase modulation
(290.5850) Scattering : Scattering, particles

ToC Category:

Original Manuscript: July 28, 2008
Revised Manuscript: September 25, 2008
Manuscript Accepted: October 19, 2008
Published: November 21, 2008

Virtual Issues
Vol. 4, Iss. 2 Virtual Journal for Biomedical Optics

Xiang Yu, Yukihiro Araki, Kentaro Iwami, and Norihiro Umeda, "Measurement of nanoparticle sizes by conventional optical microscopy with standing evanescent field illumination," Opt. Lett. 33, 2794-2796 (2008)

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