Enhanced spatial resolution in third-harmonic microscopy through polarization switching
Optics Letters, Vol. 34, Issue 8, pp. 1240-1242 doi:10.1364/OL.34.001240
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- OCIS Codes:
- (100.5070) Image processing : Phase retrieval
- (180.5810) Microscopy : Scanning microscopy
- (230.6120) Optical devices : Spatial light modulators
- (260.5430) Physical optics : Polarization
- (320.7110) Ultrafast optics : Ultrafast nonlinear optics
- (180.4315) Microscopy : Nonlinear microscopy
Microscopy
Citation
Omid Masihzadeh, Philip Schlup, and Randy A. Bartels, "Enhanced spatial resolution in third-harmonic microscopy through polarization switching," Opt. Lett. 34, 1240-1242 (2009)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-34-8-1240
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Enhanced spatial resolution in third-harmonic generation (THG) microscopy is demonstrated through manipulation of the polarization state across the focal field of a microscope. Enhancements in resolution of up to a factor of 2 are observed for a focal field linearly polarized at the center and switched to circularly polarized at the beam edges. As THG scattering is suppressed for circular polarization, the THG signal diameter is reduced, improving spatial resolution.
© 2009 Optical Society of America
» View Full Text: Acrobat PDF (203 KB)
History
Original Manuscript: January 23, 2009
Manuscript Accepted: February 28, 2009
Published: April 10, 2009
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Author Affiliations
Colorado State University
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