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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 12 — Jun. 15, 2010
  • pp: 1992–1994

Generic gamma correction for accuracy enhancement in fringe-projection profilometry

Thang Hoang, Bing Pan, Dung Nguyen, and Zhaoyang Wang  »View Author Affiliations


Optics Letters, Vol. 35, Issue 12, pp. 1992-1994 (2010)
http://dx.doi.org/10.1364/OL.35.001992


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Abstract

Fringe-projection profilometry is one of the most commonly used noncontact methods for acquiring the three- dimensional (3D) shape information of objects. In practice, the luminance nonlinearity caused by the gamma effect of a digital projector and a digital camera yields undesired fringe intensity changes, which substantially reduce the measurement accuracy. In this Letter, we present a robust and simple scheme to eliminate the intensity nonlinearity induced by the gamma effect by combining a universal phase-shifting algorithm with a gamma correction method. First, by using three-step and large-step phase-shifting techniques, the gamma value involved in the measurement system can be detected. Then, a gamma pre-encoding process is applied to the system for actual 3D shape measurements. With the proposed technique, high accuracy of measurement can be achieved with the conventional small-step phase-shifting algorithm. The validity of the technique is verified by experiments.

© 2010 Optical Society of America

OCIS Codes
(110.6880) Imaging systems : Three-dimensional image acquisition
(120.2830) Instrumentation, measurement, and metrology : Height measurements
(120.6660) Instrumentation, measurement, and metrology : Surface measurements, roughness
(150.6910) Machine vision : Three-dimensional sensing

ToC Category:
Imaging Systems

History
Original Manuscript: March 29, 2010
Manuscript Accepted: May 11, 2010
Published: June 7, 2010

Citation
Thang Hoang, Bing Pan, Dung Nguyen, and Zhaoyang Wang, "Generic gamma correction for accuracy enhancement in fringe-projection profilometry," Opt. Lett. 35, 1992-1994 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-12-1992


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