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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 16 — Aug. 15, 2010
  • pp: 2699–2701

Signal-to-noise performance of a short-wave infrared nanoinjection imager

Omer Gokalp Memis, John Kohoutek, Wei Wu, Ryan M. Gelfand, and Hooman Mohseni  »View Author Affiliations


Optics Letters, Vol. 35, Issue 16, pp. 2699-2701 (2010)
http://dx.doi.org/10.1364/OL.35.002699


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Abstract

We report on the signal-to-noise performance of a nanoinjection imager, which is based on a short-wave IR InGaAs/GaAsSb/InP detector with an internal avalanche-free amplification mechanism. Test pixels in the imager show responsivity values reaching 250A/W at 1550nm, −75°C, and 1.5V due to an internal charge amplification mechanism in the detector. In the imager, the measured imager noise was 28 electrons (e) rms at a frame rate of 1950frames/s. Additionally, compared to a high-end short-wave IR imager, the nanoinjection camera shows 2 orders of magnitude improved signal-to-noise ratio at thermoelectric cooling temperatures primarily due to the small excess noise at high amplification.

© 2010 Optical Society of America

OCIS Codes
(040.3780) Detectors : Low light level
(110.3080) Imaging systems : Infrared imaging

ToC Category:
Imaging Systems

History
Original Manuscript: April 23, 2010
Revised Manuscript: June 22, 2010
Manuscript Accepted: July 13, 2010
Published: August 6, 2010

Citation
Omer Gokalp Memis, John Kohoutek, Wei Wu, Ryan M. Gelfand, and Hooman Mohseni, "Signal-to-noise performance of a short-wave infrared nanoinjection imager," Opt. Lett. 35, 2699-2701 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-16-2699

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