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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 16 — Aug. 15, 2010
  • pp: 2801–2803

Spatially mapping random lasing cavities

R. C. Polson and Z. V. Vardeny  »View Author Affiliations

Optics Letters, Vol. 35, Issue 16, pp. 2801-2803 (2010)

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A mapping technique is developed to spatially resolve random laser-emission spectra from disordered solid media with an optical gain above the threshold excitation intensity for lasing; the technique is applied to π-conjugated polymer 1 ms . By mapping the spatial extent of emission peaks in the random laser spectrum, bright areas that correspond to naturally formed lasing microcavities are unraveled. The size of the obtained microcavities matches the size extracted from the Fourier transform analysis of the laser-emission spectrum. Mapping at increased excitation intensities shows multiple resonant microcavities that lase at increasing threshold intensities.

© 2010 Optical Society of America

OCIS Codes
(140.3580) Lasers and laser optics : Lasers, solid-state
(290.4210) Scattering : Multiple scattering
(310.2790) Thin films : Guided waves
(140.3945) Lasers and laser optics : Microcavities

ToC Category:
Lasers and Laser Optics

Original Manuscript: April 16, 2010
Revised Manuscript: June 28, 2010
Manuscript Accepted: July 2, 2010
Published: August 13, 2010

R. C. Polson and Z. V. Vardeny, "Spatially mapping random lasing cavities," Opt. Lett. 35, 2801-2803 (2010)

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