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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 19 — Oct. 1, 2010
  • pp: 3291–3293

Multiple-plane anisoplanatic phase correction in a laboratory digital holography experiment

Abbie E. Tippie and James R. Fienup  »View Author Affiliations


Optics Letters, Vol. 35, Issue 19, pp. 3291-3293 (2010)
http://dx.doi.org/10.1364/OL.35.003291


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Abstract

We present results for a digital holography experiment with anisoplanatic image correction through two discrete planes of phase errors. Using a nonlinear optimization technique, we maximize a modified sharpness metric to solve for estimates of the phase errors in the system in the multiple planes where they physically exist. We show that correcting for phase errors in multiple planes gives a superior image to correction in one plane.

© 2010 Optical Society of America

OCIS Codes
(090.1000) Holography : Aberration compensation
(110.6150) Imaging systems : Speckle imaging
(090.1995) Holography : Digital holography
(110.3010) Imaging systems : Image reconstruction techniques

ToC Category:
Holography

History
Original Manuscript: June 4, 2010
Revised Manuscript: July 27, 2010
Manuscript Accepted: August 19, 2010
Published: September 30, 2010

Citation
Abbie E. Tippie and James R. Fienup, "Multiple-plane anisoplanatic phase correction in a laboratory digital holography experiment," Opt. Lett. 35, 3291-3293 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-19-3291


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