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Optics Letters

Optics Letters


  • Editor: Alan E. Willner
  • Vol. 35, Iss. 21 — Nov. 1, 2010
  • pp: 3610–3612

Zernike apodized photon sieves for high-resolution phase-contrast x-ray microscopy

Guanxiao Cheng, Chao Hu, Ping Xu, and Tingwen Xing  »View Author Affiliations

Optics Letters, Vol. 35, Issue 21, pp. 3610-3612 (2010)

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We present a type of diffractive lens, Zernike apodized photon sieves (ZAPS), used as the objective for high spatial resolution and high phase-contrast imaging of weakly absorbing materials in x rays. The structure of ZAPS is based on the combination of two concepts: apodized photon sieves and Zernike phase contrast. The ZAPS is a single optic that integrates the appropriate ± π / 2 rad phase shift through selective zone placement shifts in an apodized photon sieve. Analysis of the focusing properties of the apodized photon sieve in terms of point-spread function show that the sidelobes have been significantly suppressed at the expense of slightly widening the width of the main lobe. In combination with synchrotron light sources, ZAPS offers new opportunities for high-resolution phase-contrast x-ray microscopy in the physical and life sciences.

© 2010 Optical Society of America

OCIS Codes
(220.1230) Optical design and fabrication : Apodization
(340.7460) X-ray optics : X-ray microscopy
(050.1965) Diffraction and gratings : Diffractive lenses

ToC Category:
X-ray Optics

Original Manuscript: June 21, 2010
Revised Manuscript: September 8, 2010
Manuscript Accepted: September 28, 2010
Published: October 21, 2010

Guanxiao Cheng, Chao Hu, Ping Xu, and Tingwen Xing, "Zernike apodized photon sieves for high-resolution phase-contrast x-ray microscopy," Opt. Lett. 35, 3610-3612 (2010)

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