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Optics Letters

Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 21 — Nov. 1, 2010
  • pp: 3643–3645

Direct near-field phase measurement of laser diodes employing a single-mode fiber interferometer

Yu-Kuan Lu, Pochi Yeh, and Wood-Hi Cheng  »View Author Affiliations


Optics Letters, Vol. 35, Issue 21, pp. 3643-3645 (2010)
http://dx.doi.org/10.1364/OL.35.003643


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Abstract

A method of direct measurement of near-field phase and intensity distribution of laser diodes employing a single-mode fiber interferometer is proposed and demonstrated. The phase and intensity of the output beam of the laser in the vicinity of the output facet are measured directly via interferometry. Using a 980 nm laser diode as an example, we obtained a beam width of 0.9 and 3.6 μm at the output facet in the vertical and horizontal axes, respectively. In addition, the phase information of the output beam was also obtained by using interferometry. This technique is particularly useful for laser diodes whose near-field phases are difficult to measure directly. The measured vertical and horizontal wavefront radius of curvatures of a laser diode are in good agreement with the calculation from Gaussian beam theory. Detailed understanding and measurement of the near-field phase and intensity distributions of light sources and optical components are essential for micro-optic designs with better mode matching to minimize the insertion loss.

© 2010 Optical Society of America

OCIS Codes
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(140.3295) Lasers and laser optics : Laser beam characterization

ToC Category:
Lasers and Laser Optics

History
Original Manuscript: August 13, 2010
Revised Manuscript: September 27, 2010
Manuscript Accepted: October 1, 2010
Published: October 26, 2010

Citation
Yu-Kuan Lu, Pochi Yeh, and Wood-Hi Cheng, "Direct near-field phase measurement of laser diodes employing a single-mode fiber interferometer," Opt. Lett. 35, 3643-3645 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-21-3643

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