Loss measurement of plasmonic modes in planar metal–insulator–metal waveguides by an attenuated total reflection method
Optics Letters, Vol. 35, Issue 22, pp. 3814-3816 (2010)
http://dx.doi.org/10.1364/OL.35.003814
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Abstract
We report experimental excitation and characterization of surface plasmon modes in planar metal–insulator–metal (MIM) waveguides. Our approach is based on determining the width of the reflection angular spectrum in the attenuated total reflection (ATR) configuration. Owing to its transverse character, the ATR configuration provides a more straightforward and simpler way to determine the loss of plasmonic modes in MIM structures, compared to using tapered end couplers with multiple waveguide samples or scanning near-field optical microscopy. In this Letter, two waveguide structures with Au claddings and
© 2010 Optical Society of America
OCIS Codes
(230.7370) Optical devices : Waveguides
(240.6680) Optics at surfaces : Surface plasmons
(250.5300) Optoelectronics : Photonic integrated circuits
ToC Category:
Optical Devices
History
Original Manuscript: August 16, 2010
Revised Manuscript: October 15, 2010
Manuscript Accepted: October 20, 2010
Published: November 9, 2010
Citation
Chien-I Lin and Thomas K. Gaylord, "Loss measurement of plasmonic modes in planar metal–insulator–metal waveguides by an attenuated total reflection method," Opt. Lett. 35, 3814-3816 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-22-3814
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