Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry
Optics Letters, Vol. 35, Issue 3, pp. 360-362 (2010)
http://dx.doi.org/10.1364/OL.35.000360
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Abstract
We present measurements of morphological features in a thick turbid sample using light-scattering spectroscopy (LSS) and Fourier-domain low-coherence interferometry (fLCI) by processing with the dual-window (DW) method. A parallel frequency domain optical coherence tomography (OCT) system with a white-light source is used to image a two-layer phantom containing polystyrene beads of diameters 4.00 and
© 2010 Optical Society of America
OCIS Codes
(110.4500) Imaging systems : Optical coherence tomography
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(290.1350) Scattering : Backscattering
(300.0300) Spectroscopy : Spectroscopy
ToC Category:
Scattering
History
Original Manuscript: September 25, 2009
Revised Manuscript: November 24, 2009
Manuscript Accepted: December 3, 2009
Published: January 26, 2010
Virtual Issues
Vol. 5, Iss. 4 Virtual Journal for Biomedical Optics
Citation
Francisco E. Robles and Adam Wax, "Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry," Opt. Lett. 35, 360-362 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-3-360
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