Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy
Optics Letters, Vol. 35, Issue 5, pp. 712-714 (2010)
http://dx.doi.org/10.1364/OL.35.000712
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Abstract
A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments.
© 2010 Optical Society of America
OCIS Codes
(090.2880) Holography : Holographic interferometry
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(180.3170) Microscopy : Interference microscopy
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: December 7, 2009
Revised Manuscript: January 24, 2010
Manuscript Accepted: January 25, 2010
Published: February 25, 2010
Virtual Issues
Vol. 5, Iss. 6 Virtual Journal for Biomedical Optics
Citation
Peng Gao, Irina Harder, Vanusch Nercissian, Klaus Mantel, and Baoli Yao, "Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy," Opt. Lett. 35, 712-714 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-5-712
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