Nondestructive analysis of coated periodic nanostructures from optical data
Optics Letters, Vol. 35, Issue 5, pp. 733-735 (2010)
http://dx.doi.org/10.1364/OL.35.000733
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Abstract
Optical data are essential for the accurate nondestructive determination of profiles of periodic structures in integrated-circuit technology. In rigorous coupled-wave analysis, the sample is generally modeled as layers consisting of a single material and the ambient. We extend present capabilities to the analysis of structures with overlayers and demonstrate our approach by determining quantitatively the thicknesses of top, sidewall, and bottom oxides of deliberately and naturally oxidized structures.
© 2010 Optical Society of America
OCIS Codes
(120.4290) Instrumentation, measurement, and metrology : Nondestructive testing
(160.6000) Materials : Semiconductor materials
ToC Category:
Materials
History
Original Manuscript: August 28, 2009
Revised Manuscript: December 21, 2009
Manuscript Accepted: January 7, 2010
Published: February 26, 2010
Citation
T. H. Ghong, S.-H. Han, J.-M. Chung, J. S. Byun, T. J. Kim, D. E. Aspnes, Y. D. Kim, I. H. Park, and Y.-W. Kim, "Nondestructive analysis of coated periodic nanostructures from optical data," Opt. Lett. 35, 733-735 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-5-733
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