Quantitative infrared imaging of silicon-on-insulator microring resonators
Optics Letters, Vol. 35, Issue 5, pp. 784-786 (2010)
http://dx.doi.org/10.1364/OL.35.000784
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Abstract
There is considerable research activity in multiresonator optical circuits in silicon photonics, e.g., for higher-order filters, advanced modulation format coding/decoding, or coupled-resonator optical waveguide delay lines. In diagnostics of such structures, it is usually not possible to measure each individual microring resonator without adding separate input and output waveguides to each resonator. We demonstrate a non-invasive diagnostic method of quantitative IR imaging, applied here to a series cascade of rings. The IR images contain information on the otherwise inaccessible individual through ports and the resonators themselves, providing an efficient means to obtain coupling, loss, and intensity-enhancement parameters for the individual rings.
© 2010 Optical Society of America
OCIS Codes
(110.3080) Imaging systems : Infrared imaging
(130.3120) Integrated optics : Integrated optics devices
(230.4555) Optical devices : Coupled resonators
ToC Category:
Optical Devices
History
Original Manuscript: November 2, 2009
Revised Manuscript: January 18, 2010
Manuscript Accepted: January 22, 2010
Published: February 26, 2010
Virtual Issues
March 5, 2010 Spotlight on Optics
Citation
Michael L. Cooper, Greeshma Gupta, Jung S. Park, Mark A. Schneider, Ivan B. Divliansky, and Shayan Mookherjea, "Quantitative infrared imaging of silicon-on-insulator microring resonators," Opt. Lett. 35, 784-786 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-5-784
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