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Optics Letters

| RAPID, SHORT PUBLICATIONS ON THE LATEST IN OPTICAL DISCOVERIES

  • Editor: Alan E. Willner
  • Vol. 35, Iss. 8 — Apr. 15, 2010
  • pp: 1133–1135

Multiscale analysis of subwavelength imaging with metal–dielectric multilayers

Rafał Kotyński and Tomasz Stefaniuk  »View Author Affiliations


Optics Letters, Vol. 35, Issue 8, pp. 1133-1135 (2010)
http://dx.doi.org/10.1364/OL.35.001133


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Abstract

Imaging with a layered superlens is a spatial filtering operation characterized by the point spread function (PSF). We show that in the same optical system the image of a narrow subwavelength Gaussian incident field may be surprisingly dissimilar to the PSF, and the width of the PSF is not a straightforward measure of the resolution. The FWHM or standard deviation of the PSF gives ambiguous information about the actual resolution, and imaging of objects smaller than the FWHM of the PSF is possible. A multiscale analysis of imaging gives good insight into the peculiar scale-dependent properties of subwavelength imaging.

© 2010 Optical Society of America

OCIS Codes
(050.0050) Diffraction and gratings : Diffraction and gratings
(100.6640) Image processing : Superresolution
(110.0110) Imaging systems : Imaging systems
(260.0260) Physical optics : Physical optics
(160.4236) Materials : Nanomaterials
(310.6628) Thin films : Subwavelength structures, nanostructures

ToC Category:
Materials

History
Original Manuscript: November 23, 2009
Revised Manuscript: February 15, 2010
Manuscript Accepted: February 21, 2010
Published: April 5, 2010

Citation
Rafał Kotyński and Tomasz Stefaniuk, "Multiscale analysis of subwavelength imaging with metal-dielectric multilayers," Opt. Lett. 35, 1133-1135 (2010)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-35-8-1133


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