Abstract
Phase retrieval is widely used in phase contrast microscopy. Here we present an autofocus algorithm that allows the phase of the exit wave function, from a single-material object, to be reconstructed at medium resolution from a single phase contrast image without any a priori knowledge of the imaging system or object. The algorithm is demonstrated on coherent out-of-focus electron micrographs of latex sphere calibration standards, giving RMS error over a large defocus range.
© 2011 Optical Society of America
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