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Three-dimensional coordinate measurements using a multiple-pinhole interferometer |
Optics Letters, Vol. 36, Issue 12, pp. 2260-2262 (2011)
http://dx.doi.org/10.1364/OL.36.002260
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Abstract
We propose a method for noncontact measurements of three-dimensional (3D) coordinates based on a Y-typed multiple-pinhole (MP) interferometer and demonstrate its feasibility in experiments. In this method, a Y-typed MP plate is inserted between the target and an image sensor to form a common-path interferometer. The 3D coordinates of the target are found by an effective algorithm using the discrete phase values on the measurement pinholes of the MP plate. These phase values can be directly extracted from a Fourier transform of the recorded intensity pattern without need of any iterative or phase-shifting algorithm. The method could be significant in real-time coordinate measurements and position tracking applications.
© 2011 Optical Society of America
OCIS Codes
(050.1970) Diffraction and gratings : Diffractive optics
(120.3180) Instrumentation, measurement, and metrology : Interferometry
(120.3940) Instrumentation, measurement, and metrology : Metrology
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
ToC Category:
Instrumentation, Measurement, and Metrology
History
Original Manuscript: April 28, 2011
Manuscript Accepted: May 16, 2011
Published: June 8, 2011
Citation
Cheng-Shan Guo, Ya-Nan Yu, Xin-Ting Zhang, Jia-Rui Zhao, and Hao Jiang, "Three-dimensional coordinate measurements using a multiple-pinhole interferometer," Opt. Lett. 36, 2260-2262 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-12-2260
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