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Optics Letters

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  • Editor: Alan E. Willner
  • Vol. 36, Iss. 14 — Jul. 15, 2011
  • pp: 2713–2715

Phase noise measurement of a narrow linewidth CW laser using delay line approaches

O. Llopis, P. H. Merrer, H. Brahimi, K. Saleh, and P. Lacroix  »View Author Affiliations


Optics Letters, Vol. 36, Issue 14, pp. 2713-2715 (2011)
http://dx.doi.org/10.1364/OL.36.002713


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Abstract

Two different laser phase noise measurement techniques are compared. One of these two techniques is based on a conventional and low-cost delay line system, which is usually set up for the linewidth measurement of semiconductor lasers. The results obtained with both techniques on a high-spectral-purity laser agree well and confirm the interest of the low-cost technique. Moreover, an extraction of the laser linewidth using computer-aided design tools is performed.

© 2011 Optical Society of America

OCIS Codes
(120.0120) Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology
(120.2920) Instrumentation, measurement, and metrology : Homodyning
(120.5050) Instrumentation, measurement, and metrology : Phase measurement
(290.3700) Scattering : Linewidth
(060.3510) Fiber optics and optical communications : Lasers, fiber

ToC Category:
Instrumentation, Measurement, and Metrology

History
Original Manuscript: March 16, 2011
Revised Manuscript: May 23, 2011
Manuscript Accepted: June 9, 2011
Published: July 14, 2011

Citation
O. Llopis, P. H. Merrer, H. Brahimi, K. Saleh, and P. Lacroix, "Phase noise measurement of a narrow linewidth CW laser using delay line approaches," Opt. Lett. 36, 2713-2715 (2011)
http://www.opticsinfobase.org/ol/abstract.cfm?URI=ol-36-14-2713


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